JPH0725726Y2 - 半導体試験装置のアドレス印加装置 - Google Patents

半導体試験装置のアドレス印加装置

Info

Publication number
JPH0725726Y2
JPH0725726Y2 JP13565788U JP13565788U JPH0725726Y2 JP H0725726 Y2 JPH0725726 Y2 JP H0725726Y2 JP 13565788 U JP13565788 U JP 13565788U JP 13565788 U JP13565788 U JP 13565788U JP H0725726 Y2 JPH0725726 Y2 JP H0725726Y2
Authority
JP
Japan
Prior art keywords
address
refresh
bit
semiconductor test
selection circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP13565788U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0257078U (en]
Inventor
清 福島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP13565788U priority Critical patent/JPH0725726Y2/ja
Publication of JPH0257078U publication Critical patent/JPH0257078U/ja
Application granted granted Critical
Publication of JPH0725726Y2 publication Critical patent/JPH0725726Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP13565788U 1988-10-17 1988-10-17 半導体試験装置のアドレス印加装置 Expired - Lifetime JPH0725726Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13565788U JPH0725726Y2 (ja) 1988-10-17 1988-10-17 半導体試験装置のアドレス印加装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13565788U JPH0725726Y2 (ja) 1988-10-17 1988-10-17 半導体試験装置のアドレス印加装置

Publications (2)

Publication Number Publication Date
JPH0257078U JPH0257078U (en]) 1990-04-25
JPH0725726Y2 true JPH0725726Y2 (ja) 1995-06-07

Family

ID=31395481

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13565788U Expired - Lifetime JPH0725726Y2 (ja) 1988-10-17 1988-10-17 半導体試験装置のアドレス印加装置

Country Status (1)

Country Link
JP (1) JPH0725726Y2 (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001338497A (ja) * 2000-05-24 2001-12-07 Fujitsu Ltd メモリ試験方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001338497A (ja) * 2000-05-24 2001-12-07 Fujitsu Ltd メモリ試験方法

Also Published As

Publication number Publication date
JPH0257078U (en]) 1990-04-25

Similar Documents

Publication Publication Date Title
US4300234A (en) Address pattern generator for testing a memory
JPH077260B2 (ja) 画像データ回転処理装置及びその方法
KR100315884B1 (ko) 데이타전송방법및장치
JPH0725726Y2 (ja) 半導体試験装置のアドレス印加装置
JPH0425554B2 (en])
KR950703188A (ko) 화상 처리 장치 및 방법 및 화상 처리부를 갖고 있는 게임기(Image Processing Device and Method Therefor, and Game Machine Having Image Processing Part)
JP2001273800A (ja) 半導体集積回路
JPS63166100A (ja) アドレス変換方式
JPS6338715B2 (en])
JPS61274280A (ja) パタ−ン発生装置
JPS61156195A (ja) イメ−ジデ−タ回転回路
JP2824853B2 (ja) パターンデータ書込み方式
JP2761560B2 (ja) 半導体メモリ試験装置用アドレス変換器
JP2607561Y2 (ja) 半導体メモリ試験装置
JPS626490A (ja) ダイナミツク型半導体記憶装置
JP3350866B2 (ja) メモリ試験装置
JP2590695B2 (ja) 時分割スイッチ回路
JP2545719Y2 (ja) メモリ試験データ選択回路
JPH03288194A (ja) カーソル記憶制御回路
JPS6246354A (ja) ペ−ジ履歴メモリ制御方式
JPH06223205A (ja) データ処理装置
JPH06131519A (ja) Ｉｃカード
JPH07191099A (ja) Ｉｃ検査装置
JPS61202252A (ja) デ−タ処理回路
JPH1097799A (ja) 半導体メモリ